Materials characterization is essential for understanding the relationship between the structure, composition, defects, and properties of materials. Advanced characterization techniques provide valuable information about crystal structure, microstructure, lattice parameters, chemical composition, and defects, enabling the evaluation and optimization of material performance.

This laboratory introduces characterization methods such as X-ray Diffraction (XRD), Scanning Electron Microscopy (SEM), Transmission Electron Microscopy (TEM), Electron Probe Microanalysis (EPMA), and X-ray Fluorescence (XRF). Through these experiments, learners will study crystal structures, crystallite size, elemental composition, diffraction patterns, and microstructural features, while gaining practical skills in analyzing and interpreting characterization data used in materials science and engineering.